DR JONATHAN REED ALIEN ENCOUNTER - TECHNICAL DATA OF THE LINK ARTIFACT. DAN MCEVOY - ODISEALINK.COM.

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• Description : DR JONATHAN REED & DAN MCEVOY RELEA...(more)SE TECHNICAL INFORMATION CONCERNING THE LINK ARTIFACT ODISEALINK.COM. ________________________________________ RESULTS OF THE LINK ARTIFACT RELEASED TO PUBLIC. REPORT BY RODOLFO GARRIDO NANOTECHNOLOGIC ANALYSIS OF THE LINK ARTIFACT Authors in which this study was based on: Herb Goronkin, Paul Von Allmen, Raymond K. Tsui, and Theodore X. Zhu, NASA, AMES Institute. 1. INTRODUCTION The recent introduction of the Link artifact to all venues of information has demanded an analysis and a scientific explanation of its properties and capabilities, such as tele-transportation. Due to the fact that this artifact possesses technological functions that go way beyond our scientific advances, its analysis should be focused towards the most advanced technology in the world: Nanotechnology. Before I begin this analysis, I will first exhibit the physical properties of the Link artifact. 2. PHYSICAL PROPERTIES Measurements Length 4 Inches Wide 3 ? Inches Thickness 3/16 Inches Material Silicon Polymer Beryllium Aluminum Magnesium Copper Zinc Bismuth Gold Other unknown materials Components One-piece, silver-colored metal cuff composed of similar thin membranes in the form of layers individually separated from each other. Some measuring as thin as 3 microns in thickness, with a total of 18 layers forming the metallic thickness of the Link. It has three needles of different lengths; each is anchored on three emerald spherically shaped bases. A membrane of extremely small carbon tubes (nanotubes) dresses the inside of the link. This data was provided by the University of Osaka, Japan (year 2000) 3. NANOTECHNOLOGICAL ANALYSIS 3.1 Exterior Aspects: Black membrane, axial outlined that is united by knots when crossing each other. Uniform surface, axial finish on the inferior metallic borders, exposing connection terminals to induce semiconductors. The bulk of the membrane is less than 4 microns, making this the best measurement for this type of manufacturing developed under the Chemical Steam technique at the Science Academy in China in 1996. (less)